Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By Manoj Sachdev, José Pineda de Gyvez
Hardcover
AED
1,023
34
AED 1,590.00
35% OFF
Free Delivery29 Nov - 9 Dec
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Softcover Reprint of the Original 1st 2011)
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Softcover Reprint of the Original 1st 2011)
By Amir Zjajo, José Pineda de Gyvez
Paperback
AED
278
12
AED 897.00
68% OFF
Turbo
Free Delivery26 - 27 Nov
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
By Amir Zjajo, José Pineda de Gyvez
Hardcover
AED
290
23
AED 511.00
43% OFF
Free Delivery29 Nov - 9 Dec
Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Softcover Reprint of the Original 1st 1993)
Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Softcover Reprint of the Original 1st 1993)
By José Pineda de Gyvez
Paperback
AED
457
76
AED 684.00
33% OFF
Turbo
Free Delivery25 - 26 Nov
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By Manoj Sachdev, José Pineda de Gyvez
Paperback
AED
749
60
AED 1,103.00
32% OFF
Turbo
Free Delivery25 - 26 Nov
Need Help?
+971 6 731 0280
support@gzb.ae
About UsContact UsPayment MethodsFAQsShipping PolicyRefund and ReturnTerms of UsePrivacy PolicyCookie Notice
VisaMastercardCash on Delivery

© 2024 White Lion General Trading LLC. All rights reserved.